Application of thin film phase thickness to determination of its refractive index dispersion from transmittance measurements

// <I>Proceedings<D> of the 9th workshop on ''Nanoscience and Nanotechnology'', Sofia, 2008. - Sofia : Heron Press, Sofia, 2008, p. 133-140.

M. Nenkov; T. Pencheva

$Application of thin film phase thickness to determination of its refractive index dispersion from transmittance measurements$

Детайли

Допълнителна информация

ISBN: ISSN 1313-4965
Отрасъл: Художествена литература
Системен №: 16652
Допълнителна сигнатура: A 67

Действия

APA Chicago / Turabian (16th edition) Harvard MLA (7th edition)

Nenkov, M., Pencheva, T. Application of thin film phase thickness to determination of its refractive index dispersion from transmittance measurements, , , ISSN 1313-4965.

Nenkov, M., Pencheva, T. . Application of thin film phase thickness to determination of its refractive index dispersion from transmittance measurements. : , , ISSN 1313-4965.

Nenkov, M., Pencheva, T. () Application of thin film phase thickness to determination of its refractive index dispersion from transmittance measurements, : , ISSN 1313-4965

Nenkov, M., & Pencheva, T. (). Application of thin film phase thickness to determination of its refractive index dispersion from transmittance measurements. // <I>Proceedings<D> of the 9th workshop on ''Nanoscience and Nanotechnology'', Sofia, 2008. - Sofia : Heron Press, Sofia, 2008, p. 133-140..