Nancheva, N., Docheva, P., Misheva, M., Djourelov, N. A Study of Defect Structure of Sputter-Deposited SnOx Film using the Doppler Broadening of the Annihilation Line,
, 1998.
Nancheva, N., Docheva, P., Misheva, M., Djourelov, N. .
A Study of Defect Structure of Sputter-Deposited SnOx Film using the Doppler Broadening of the Annihilation Line.
: , 1998.
Nancheva, N., Docheva, P., Misheva, M., Djourelov, N. (1998)
A Study of Defect Structure of Sputter-Deposited SnOx Film using the Doppler Broadening of the Annihilation Line,
:
Nancheva, N.,
Docheva, P.,
Misheva, M., &
Djourelov, N.
(1998).
A Study of Defect Structure of Sputter-Deposited SnOx Film using the Doppler Broadening of the Annihilation Line. // <I>Bulgarian<D> Journal of Physics, 25, 1998, № 3-4, p. 171-176..