Investigation of the Effect of Oxygen and Substrate Bias on the Defect Structure of Sputer-Deposited SnOx Films

// <I>Scripta Materialia<D>, 37(12), 1997, p. 1957-1962.

P. Docheva; N. Nancheva; P. Hadzhiyska; M. Misheva; N. Djourelov

Investigation of the Effect of Oxygen and Substrate Bias on the Defect Structure of Sputer-Deposited SnOx Films

Детайли

Година на издаване: 1997

Отрасъл: Художествена литература
Забележка: Други авт.: N. Nancheva, P. Hadzhiyska, M. Misheva, N. Djurelov.
Системен №: 6099

Действия

APA Chicago / Turabian (16th edition) Harvard MLA (7th edition)

Docheva, P., Nancheva, N., Hadzhiyska, P., Misheva, M., Djourelov, N. Investigation of the Effect of Oxygen and Substrate Bias on the Defect Structure of Sputer-Deposited SnOx Films, , 1997.

Docheva, P., Nancheva, N., Hadzhiyska, P., Misheva, M., Djourelov, N. . Investigation of the Effect of Oxygen and Substrate Bias on the Defect Structure of Sputer-Deposited SnOx Films. : , 1997.

Docheva, P., Nancheva, N., Hadzhiyska, P., Misheva, M., Djourelov, N. (1997) Investigation of the Effect of Oxygen and Substrate Bias on the Defect Structure of Sputer-Deposited SnOx Films, :

Docheva, P., Nancheva, N., Hadzhiyska, P., Misheva, M., & Djourelov, N. (1997). Investigation of the Effect of Oxygen and Substrate Bias on the Defect Structure of Sputer-Deposited SnOx Films. // <I>Scripta Materialia<D>, 37(12), 1997, p. 1957-1962..

Investigation of the Effect of Oxygen and Substrate Bias on the Defect Structure of Sputer-Deposited SnOx Films

Детайли

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Действия