Phase thickness approach for determination of thin film refractive index dispersion from transmittance spectra

// <I>EPJ AP<D> : The European physical journal applied physics, 42, 2008, № 3, p. 219-228.

M. Nenkov; T. Pencheva

$Phase thickness approach for determination of thin film refractive index dispersion from transmittance spectra$

Детайли

Допълнителна информация

ISBN: ISSN 1286-0042
Отрасъл: Художествена литература
Забележка: SJR - 0,261/2017
Системен №: 16590
Допълнителна сигнатура: ! 4958

Действия

APA Chicago / Turabian (16th edition) Harvard MLA (7th edition)

Nenkov, M., Pencheva, T. Phase thickness approach for determination of thin film refractive index dispersion from transmittance spectra, , , ISSN 1286-0042.

Nenkov, M., Pencheva, T. . Phase thickness approach for determination of thin film refractive index dispersion from transmittance spectra. : , , ISSN 1286-0042.

Nenkov, M., Pencheva, T. () Phase thickness approach for determination of thin film refractive index dispersion from transmittance spectra, : , ISSN 1286-0042

Nenkov, M., & Pencheva, T. (). Phase thickness approach for determination of thin film refractive index dispersion from transmittance spectra. // <I>EPJ AP<D> : The European physical journal applied physics, 42, 2008, № 3, p. 219-228..